MSE 298 Seminar: Tailoring the Nanoscale Through Ion Beam Modification
Associate Professor
Department of the Nuclear Engineering
Director of the Tennessee Ion Beam Materials Lab
The University of Tennessee, Knoxville
Abstract: Understanding the relationship between process, structure and properties of materials has been core to humanity’s progress since the Stone Age. Recent advancements in nanoscale modification and characterization tools along with exponential growth in computational capabilities have greatly expanded our ability to understand and control the properties of materials down to the nanoscale. Ion beam modification (IBM) of materials has become essential to most nanoscale processes to control the structure, microstructure and subsequent properties of materials. Similarly, transmission electron microscopy (TEM) has become linked with nanoscale characterization. This presentation will highlight both IBM and TEM abilities to create and characterize the interesting, and often unexpected microstructures and subsequent properties that are possible far-from-equilibrium. It will then discuss the physical limits and engineering challenges to investigating materials in coupled extreme environments including high temperature, displacement damage, corrosive conditions and many more. This presentation will conclude with the current and planned in situ ion beam-based techniques including acoustic emission, ion beam induced luminescence, transmission electron microscopy (TEM) and pump-probe laser-based techniques that are being developed at the Tennessee Ion Beam Materials Laboratory.
Bio: Khalid Hattar is a new associate professor in the Department of Nuclear Engineering at the University of Tennessee, Knoxville and director of theTennessee Ion Beam Materials Lab. Hattar has over 17 years of experience in radiation damage effects and in situ electron microscopy in a large range of materials systems. He has developed a range of in situ techniques to explore the microstructural and property response of materials to combined extreme conditions at both the TEM and SEM length scale.
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