Novel Generic Formulas and Relations for the Ergodic Capacity and Average Bit Error Rate over Generalized Fading Channels
Bren Hall 3011
Speaker: Prof. Mohamed-Slim Alouini, Professor of Electrical Engineering, KAUST, Saudi Arabia ABSTRACT Analysis of the average binary error probabilities (ABEP) and ergodic capacity (EC) of wireless communications systems over generalized fading channels have been considered separately in the past. This talk introduces a novel moment generating function (MGF)-based unified approach for the exact computation of the ABEP and EC of single and multiple link communication with maximal ratio combining. This approach leads to a generic unified performance expression that can be easily calculated and that is applicable to a wide variety of fading scenarios. The talk introduces also a new analytical connection between the EC and the ABEP of binary modulation schemes. In particular formulas to obtainthe EC from the ABEP and vice versa are proposed. Analytical and numerical examples are provided to illustrate the mathematical formalism for a variety of fading conditions. SPEAKER'S BIOGRAPHY Mohamed-Slim Alouini was born in Tunis, Tunisia. He received the Ph.D. degree in electrical engineering from the California Institute of Technology (Caltech), Pasadena, CA, USA, in 1998. He was with the department of Electrical and Computer Engineering of the University of Minnesota, Minneapolis, MN, USA, then with the Electrical and Computer Engineering Program at the Texas A&M University at Qatar, Education City, Doha, Qatar. Since June 2009, he has been a Professor of Electrical Engineering in the Division of Physical Sciences and Engineering at KAUST, Saudi Arabia, where his current research interests include the design and performance analysis of wireless communication systems.