Introduction to Materials Characterization at UC Irvine
Featuring: Dr. Jian-Guo Zheng
Laboratory for Electron and X-ray instrumentation
Materials Characterization is one of key components of materials science which investigates the relationship between the structure of materials at atomic or molecular scales and their macroscopic properties.Materials Characterization studies the crystal structure, microstructure and composition of materials by means of microscopy and spectroscopy.
Commonly used materials characterization techniques include optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), x-ray diffraction techniques (XRD), atomic force microscopy (AFM), field ion microscopy (FIM), x-ray energy-dispersive spectroscopy (EDS), wavelength dispersive x-ray spectroscopy (WDX), electron energy loss spectroscopy (EELS), x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy, secondary ion mass spectrometry (SIMS), mass spectrometry and impulse excitation technique (IET).
This talk will briefly introduce some materials characterization instruments and techniques available at UCI, especially in Materials Characterization Center and Calit2 Microscopy Center, including their principles and applications in materials science.
Dr. Jian-Guo Zheng is a project scientist in Calit2 and director of operation of the laboratory for electron and x-ray instrumentation, a campus-wide shared user facility for materials characterization at UCI. He is also an elected Fellow of the Royal Microscopic Society (UK) and holds an adjunct professor position in Nanjing University (China). His expertise is in advanced electron microscopy, materials characterization and materials physics. He has authored/coauthored more than 60 peer-reviewed scientific publications. Prior to joining UCI, Dr. Zheng was a research assistant professor in materials science and engineering and manager of electron probe instrumentation center at Northwestern University (US), a senior experimental officer in electron microscopy at the University of Liverpool (UK), and an associate professor in physics at Nanjing University (China).